IEC/TS 62607-5-3 Ed. 1.0 en:2020 PDF

IEC/TS 62607-5-3 Ed. 1.0 en:2020 PDF

Name:
IEC/TS 62607-5-3 Ed. 1.0 en:2020 PDF

Published Date:
04/14/2020

Status:
Active

Description:

Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices ¿¿¿ Measurements of charge carrier concentration

Publisher:
International Electrotechnical Commission - Technical Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$43.5
Need Help?
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
Edition : 1.0
File Size : 1 file , 1.7 MB
Note : This product is unavailable in Canada
Number of Pages : 20
Published : 04/14/2020

History


Related products

IEC/TS 62622 Ed. 1.0 en:2012
Published Date: 10/02/2012
Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings
$83.4

Best-Selling Products